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分類 論文誌
著者名 (author) Masahide Nakamura,Tohru Kikuno
英文著者名 (author)
キー (key) Masahide Nakamura, Tohru Kikuno
表題 (title) A new approach in feature interaction testing
表題 (英文)
定期刊行物名 (journal) INTEGRATION the VLSI journal
定期刊行物名 (英文)
巻数 (volume) 26
号数 (number)
ページ範囲 (pages) 211--223
刊行月 (month) December
出版年 (year) 1998
付加情報 (note)
注釈 (annote)
内容梗概 (abstract)
論文電子ファイル


[1-56]  Masahide Nakamura and Tohru Kikuno, ``A New Approach in Feature Interaction Testing,'' INTEGRATION the VLSI journal, vol.26, pp.211--223, December 1998.

@article{1_56,
    author = {Masahide Nakamura and Tohru Kikuno},
    author_e = {},
    title = {A new approach in feature interaction testing},
    title_e = {},
    journal = {INTEGRATION the VLSI journal},
    journal_e = {},
    volume = {26},
    number = {},
    pages = {211--223},
    month = {December},
    year = {1998},
    note = {},
    annote = {}
}

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